| Part number: | SNJ54BCT8373AFK |
| Description: | SCAN TEST DEVICES WITH OCTAL D-T |
| Manufacturer | Texas Instruments |
| Encapsulation | Tube |
| Quantity | 1 |
| RoHS | 1 |
| TYPE | DESCRIPTION |
| Mfr | "Texas Instruments" |
| Package / Case | 28-CLCC |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Latches |
| Operating Temperature | -55°C ~ 125°C |
| Supply Voltage | 4.5V ~ 5.5V |
| Supplier Device Package | 28-LCCC (11.43x11.43) |
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