| Part number: | SN74BCT8374ANT |
| Description: | IC SCAN TEST DEVICE W/FF 24-DIP |
| Manufacturer | Texas Instruments |
| Encapsulation | - |
| Quantity | 51492 |
| RoHS | YES |
| TYPE | DESCRIPTION |
| Manufacturer | Texas Instruments |
| Category | Integrated Circuits (ICs) - Logic - Specialty Logic |
| Package | 24-DIP (0.300", 7.62mm) |
| ECAD | |
| Series | 74BCT |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5 V ~ 5.5 V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP |
|
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